This model has been discontinued; please choose the upgraded AT3816A.
The AT2817 uses an ARM processor and a true-color TFT-LCD with a full Chinese operating interface (configurable to English), making the instrument simple to operate yet powerful in processing capability.
The AT2817 can test four parameters of a component simultaneously, each of which can be configured freely. The redesigned instrument provides full 6-digit display for all four primary and secondary parameters, can sweep a list of 10 frequencies or levels, and allows calibration of 3 user-defined frequencies for improved accuracy.
Fully automatic testing requires no user intervention: simply insert an L, C or R component and the instrument configures the test conditions automatically, including automatic LCR selection, automatic range selection and equivalent circuit selection.
The instrument offers test frequencies from 50Hz to 200kHz in 0.001Hz steps and any test level from 0.01V to 2.00V, with averaging up to 256 times.
Complete interfaces are provided for automatic test equipment: internal, manual, external and bus trigger modes, 14-bin sorting output and a built-in bin counting function. All instrument functions can be controlled quickly from a PC, and client software can perform statistical data analysis and print test results.